Title : 
Diagnosis of bridging faults in sequential circuits using adaptive simulation, state storage, and path-tracing
         
        
            Author : 
Venkataraman, Srikanth ; Fuchs, W. Kent
         
        
            Author_Institution : 
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
         
        
        
        
        
        
            Abstract : 
A diagnosis technique that integrates the storage of precomputed information with some dynamic computation for the diagnosis of bridging faults in synchronous sequential circuits with no-scan or partial-scan is presented. The method addresses the accuracy, storage requirements, and computational complexity required for diagnosis. A combination of adaptively simulating the behavior of a bridging fault and storing faulty state information at select vectors ensures accuracy with low storage requirements. The combination of adaptive simulation, state storage, and pathtracing has low computational requirements. Experimental results are provided for the ISCAS89 benchmark circuits
         
        
            Keywords : 
CMOS logic circuits; computational complexity; digital simulation; fault diagnosis; logic testing; sequential circuits; ISCAS89 benchmark circuits; adaptive simulation; bridging faults; computational complexity; computational requirements; diagnosis technique; no-scan; partial-scan; path-tracing; state storage; storage requirements; synchronous sequential circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Computational modeling; Computer simulation; Dictionaries; Fault diagnosis; Semiconductor device modeling; Sequential circuits;
         
        
        
        
            Conference_Titel : 
Test Conference, 1997. Proceedings., International
         
        
            Conference_Location : 
Washington, DC
         
        
        
            Print_ISBN : 
0-7803-4209-7
         
        
        
            DOI : 
10.1109/TEST.1997.639702