Embedded at-speed test probe

Author

Aigner, Mitch

Author_Institution

Integrated Instrum. Group, Tekronix Inc., Beaverton, OR, USA

fYear

1997

fDate

1-6 Nov 1997

Firstpage

932

Lastpage

937

Abstract

The addition of a small analog probe circuit to an ASIC design allows previously unreachable internal signal nodes of the ASIC to be accurately monitored and measured with conventional test equipment. The probe is essentially a high-performance analog multiplexer, that can connect to up to 16 test points inside the core of the ASIC with minimal loading, and buffer these signals accurately to a transmission line driver output connected to a dedicated pad. A 0.65μ CMOS implementation of the probe circuit provides a -3 dB bandwidth in excess of 400 MHz

Keywords

CMOS analogue integrated circuits; application specific integrated circuits; design for testability; integrated circuit testing; multiplexing equipment; probes; -3 dB bandwidth; 0.65 micron; 400 MHz; ASIC design; CMOS implementation; analog multiplexer; analog probe circuit; at-speed test probe; dedicated pad; internal signal nodes; loading; test equipment; transmission line driver output; Application specific integrated circuits; Circuit testing; Distributed parameter circuits; Driver circuits; Monitoring; Multiplexing; Probes; Signal design; Test equipment; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639708

Filename

639708