Efficient identification of non-robustly untestable path delay faults

This paper presents an efficient implication-based approach for identifying non-robustly untestable path delay faults. It starts from possible conflicts to find untestable faults by performing static implication. It is neither path-oriented nor space-search based. Experimental results for ISCAS´85 benchmark circuits demonstrate that a significant portion of non-robustly non-robustly untestable path delay faults is identified efficiently. The method can be combined easily with ATPG-based approaches for path delay testing to yield cost effective methods for path delay faults in large circuits