DocumentCode
3184227
Title
Single event effect proton and heavy ion test results in support of candidate NASA programs
Author
LaBel, K. ; Moran, A. ; Hawkins, D. ; Sanders, A. ; Seidleck, C. ; Kim, H. ; Fomey, J. ; Stassinopoulos, E.G. ; Marshall, P. ; Dale, C. ; Barry, R.
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
1995
fDate
34899
Firstpage
16
Lastpage
32
Abstract
We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. The variety of analog and digital devices tested includes ADCs, DC-DC converters, DRAMs, linear devices, and microprocessors
Keywords
errors; ion beam effects; proton effects; radiation hardening (electronics); space vehicle electronics; ADCs; DC-DC converters; DRAMs; NASA program; analog devices; digital devices; heavy ions; linear devices; microprocessors; protons; single event effects; spacecraft electronics; Aerospace electronics; Analog-digital conversion; Clocks; Electronic equipment testing; Field programmable gate arrays; NASA; Protons; Single event upset; Space vehicles; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
Conference_Location
Madison, WI
Print_ISBN
0-7803-3100-1
Type
conf
DOI
10.1109/REDW.1995.483259
Filename
483259
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