• DocumentCode
    3184679
  • Title

    Fault location in shunt capacitor banks

  • Author

    Samineni, S. ; Labuschagne, C. ; Pope, J. ; Kasztenny, B.

  • Author_Institution
    Schweitzer Eng. Labs., Inc., Pullman, WA, USA
  • fYear
    2010
  • fDate
    March 29 2010-April 1 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Shunt capacitor banks (SCBs) are used in the electrical industry for power factor correction and voltage support. Over the years, the purpose of SCBs has not changed, but as new dielectric materials came to market, the fusing practices for these banks changed from externally fused to internally fused, fuseless, and finally to unfused. While the identification of faulty capacitor units is easy with an externally fused bank, it is more complex with the other types of fusing, making maintenance and fault investigation difficult and expensive. This paper presents a novel method to identify the faulted phase in all capacitor banks and the faulted phase and section in most capacitor banks. This method can reduce the time to identify faulty units by more than 80 percent in large capacitor banks.
  • Keywords
    dielectric materials; fault diagnosis; maintenance engineering; power capacitors; power factor correction; dielectric materials; electrical industry; fault investigation; fault location; faulty capacitor; maintenance; power factor correction; shunt capacitor banks; element; fuse; fuseless; unfused; unit;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Developments in Power System Protection (DPSP 2010). Managing the Change, 10th IET International Conference on
  • Conference_Location
    Manchester
  • Type

    conf

  • DOI
    10.1049/cp.2010.0346
  • Filename
    5522203