Title :
Oversized cylindrical cavity to measure complex permittivity in millimeter waves
Author :
Maruoka, Seiji ; Nikawa, Yoshio ; Izumikawa, Taisuke ; Maji, Satoshi
Author_Institution :
Grad. Sch. of Eng., Kokushikan Univ., Tokyo, Japan
Abstract :
The measurement of complex permittivity of thin material is very important to design high frequency devices. In this study, oversized cylindrical cavity is designed by simulation for measuring complex permittivity of thin material in millimeter waves. Simulation of electromagnetic field distribution in oversized cylindrical cavity is examined from 20 to 40 GHz. Resonant mode on the edge in oversized cylindrical cavity is observed, and using whispering gallery mode for oversized cavity, accurate complex permittivity can be obtained.
Keywords :
cavity resonators; electromagnetic fields; permittivity measurement; whispering gallery modes; complex permittivity measurement; electromagnetic field distribution; frequency 20 GHz to 40 GHz; high frequency devices; oversized cylindrical cavity; resonant mode; thin material; whispering gallery mode; Dielectric materials; Dielectric measurements; Electromagnetic fields; Electromagnetic waveguides; Frequency; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Resonance; Whispering gallery modes; Complex permittivity; Millimeter wave measurement; Oversized cylindrical cavity; Whispering gallery mode;
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
DOI :
10.1109/APMC.2009.5385310
