DocumentCode
3185369
Title
Emotion recognition using dynamic grid-based HoG features
Author
Dahmane, Mohamed ; Meunier, Jean
Author_Institution
Dept. of Comput. Sci. & Oper. Res. (DIRO), Univ. of Montreal, Montreal, QC, Canada
fYear
2011
fDate
21-25 March 2011
Firstpage
884
Lastpage
888
Abstract
Automatic facial expression analysis is the most commonly studied aspect of behavior understanding and human-computer interface. The main difficulty with facial emotion recognition system is to implement general expression models. The same facial expression may vary differently across humans; this can be true even for the same person when the expression is displayed in different contexts. These factors present a significant challenge for the recognition task. The method we applied, which is reminiscent of the “baseline method”, utilizes dynamic dense appearance descriptors and statistical machine learning techniques. Histograms of oriented gradients (HoG) are used to extract the appearance features by accumulating the gradient magnitudes for a set of orientations in 1-D histograms defined over a size-adaptive dense grid, and Support Vector Machines with Radial Basis Function kernels are the base learners of emotions. The overall classification performance of the emotion detection reached 70% which is better than the 56% accuracy achieved by the “baseline method” presented by the challenge organizers.
Keywords
emotion recognition; face recognition; radial basis function networks; statistical analysis; support vector machines; automatic facial expression analysis; dynamic dense appearance descriptors; dynamic grid-based HoG features; emotion recognition; facial emotion recognition system; histograms of oriented gradients; human-computer interface; radial basis function kernels; statistical machine learning techniques; support vector machines; Face; Face recognition; Feature extraction; Histograms; Kernel; Support vector machines; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Automatic Face & Gesture Recognition and Workshops (FG 2011), 2011 IEEE International Conference on
Conference_Location
Santa Barbara, CA
Print_ISBN
978-1-4244-9140-7
Type
conf
DOI
10.1109/FG.2011.5771368
Filename
5771368
Link To Document