Collective excitation of transparent dielectrics under femtosecond pulses

Author

Efimov, O. ; Juodkazis, Saulius ; Matsuo, Shoichiro ; Misawa, H.

Author_Institution

HRL Labs., Malibu, CA, USA

fYear

2003

fDate

22-27 June 2003

Firstpage

82

Abstract

The goal of this work is to measure the intrinsic laser-induced damage (LID) of a borosilicate glass for femtosecond pulses and to compare it with data obtained for the nanopicosecond region under conditions when self-focusing is avoided. This study demonstrates that the intrinsic LID irradiance of industrial borosilicate glass does not depend on pulse duration for 2 × 10^-13 - 3 × 10^-8 s pulses. This finding is in favor of the LID mechanism, which is based on the phase transition scenario, rather than the currently accepted view based on a multi-photon ionization with ensuing avalanche development.

Keywords

borosilicate glasses; dielectric materials; high-speed optical techniques; laser beam effects; phase transformations; transparency; 2E-13 to 3E-8 s; B₂O₃SiO₂; LID irradiance; collective excitation; femtosecond pulses; industrial boro-silicate glass; laser-induced damage; phase transition; transparent dielectrics; Dielectrics; Electric breakdown; Electrons; Glass; Laboratories; Optical pulses; Optimized production technology; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics Conference, 2003. EQEC '03. European

Print_ISBN

0-7803-7733-8

Type

conf

DOI

10.1109/EQEC.2003.1313939

Filename

1313939