DocumentCode :
3185454
Title :
Collective excitation of transparent dielectrics under femtosecond pulses
Author :
Efimov, O. ; Juodkazis, Saulius ; Matsuo, Shoichiro ; Misawa, H.
Author_Institution :
HRL Labs., Malibu, CA, USA
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
82
Abstract :
The goal of this work is to measure the intrinsic laser-induced damage (LID) of a borosilicate glass for femtosecond pulses and to compare it with data obtained for the nanopicosecond region under conditions when self-focusing is avoided. This study demonstrates that the intrinsic LID irradiance of industrial borosilicate glass does not depend on pulse duration for 2 × 10-13 - 3 × 10-8 s pulses. This finding is in favor of the LID mechanism, which is based on the phase transition scenario, rather than the currently accepted view based on a multi-photon ionization with ensuing avalanche development.
Keywords :
borosilicate glasses; dielectric materials; high-speed optical techniques; laser beam effects; phase transformations; transparency; 2E-13 to 3E-8 s; B2O3SiO2; LID irradiance; collective excitation; femtosecond pulses; industrial boro-silicate glass; laser-induced damage; phase transition; transparent dielectrics; Dielectrics; Electric breakdown; Electrons; Glass; Laboratories; Optical pulses; Optimized production technology; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2003. EQEC '03. European
Print_ISBN :
0-7803-7733-8
Type :
conf
DOI :
10.1109/EQEC.2003.1313939
Filename :
1313939
Link To Document :
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