• DocumentCode
    3185498
  • Title

    Constraint-based attribute reduction in rough set analysis

  • Author

    Fan, Tuan-Fang ; Liau, Churn-Jung ; Liu, Duen-Ren

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Penghu Univ. of Sci. & Technol., Penghu, Taiwan
  • fYear
    2010
  • fDate
    10-13 Oct. 2010
  • Firstpage
    3971
  • Lastpage
    3976
  • Abstract
    Attribute reduction is very important in rough set-based data analysis (RSDA) because it can be used to simplify the induced decision rules without reducing the classification accuracy. The notion of reduct plays a key role in rough set-based attribute reduction. In rough set theory, a reduct is generally defined as a minimal subset of attributes that can classify the same domain of objects as unambiguously as the original set of attributes. Nevertheless, from a relational perspective, RSDA relies on a kind of dependency constraint. That is, the relationship between the class labels of a pair of objects depends on the componentwise comparison of their condition attributes. The larger the number of condition attributes compared, the greater the probability that the constraint will hold. Thus, elimination of condition attributes may cause more object pairs to violate the constraint. Based on this observation, a reduct can be defined alternatively as a minimal subset of attributes that does not increase the number of objects violating the constraint. While the alternative definition coincides with the original one in ordinary RSDA, it is more easily generalized to cases of fuzzy RSDA and relational data analysis.
  • Keywords
    data analysis; data reduction; fuzzy set theory; rough set theory; constraint based attribute reduction; decision rules; fuzzy RSDA; relational data analysis; rough set theory; Copper; Classical rough set; core; dominance-based rough set; fuzzy rough set; reduct; relational information system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Man and Cybernetics (SMC), 2010 IEEE International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1062-922X
  • Print_ISBN
    978-1-4244-6586-6
  • Type

    conf

  • DOI
    10.1109/ICSMC.2010.5642233
  • Filename
    5642233