Title :
Restoration of noisy scanning tunneling microscope images
Author :
van Kempen, G.M.P. ; Scholte, P.M.L.O. ; Young, I.T. ; Tuinstra, F.
Author_Institution :
Fac. of Appl. Phys., Delft Univ. of Technol., Netherlands
Abstract :
We have compared and improved several implementations of the Wiener filter to remove noise effects from scanning tunneling microscope (STM) images. We have found that the implementation of Weisman et al. (1992), using the noise model of Stoll et al. (1987), provides the best performance on both simulated and real STM images
Keywords :
scanning tunnelling microscopy; Wiener filter; image restoration; noise model; noisy images; scanning tunneling microscope images; Additive noise; Atomic measurements; Fourier transforms; Frequency; Image restoration; Low-frequency noise; Microscopy; Noise measurement; Tunneling; Wiener filter;
Conference_Titel :
Pattern Recognition, 1994. Vol. 3 - Conference C: Signal Processing, Proceedings of the 12th IAPR International Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6275-1
DOI :
10.1109/ICPR.1994.577138
