• DocumentCode
    3185619
  • Title

    Resonant sensors for high accuracy pressure measurement using silicon technology

  • Author

    Parson, P. ; Glendinning, A. ; Angelidis, D.

  • Author_Institution
    Schlumberger Ind., Farnborough, UK
  • fYear
    1992
  • fDate
    18-22 May 1992
  • Firstpage
    349
  • Abstract
    A resonant element transducer has been developed for aerospace applications using micromachined silicon technology. The sensor is a beam supported over a square diaphragm. The resonant frequency of the beam is proportional to the applied pressure on the diaphragm. The authors describe the process of sensor construction, report on its physical characteristics, and summarize the performance evaluations which have been conducted to determine resonance frequency quality factor, temperature coefficient, and temperature and pressure hysteresis
  • Keywords
    electric sensing devices; elemental semiconductors; micromechanical devices; pressure measurement; pressure sensors; pressure transducers; resonators; silicon; aerospace applications; micromachined Si technology; pressure hysteresis; pressure measurement; quality factor; resonant beam; resonant frequency; temperature coefficient; temperature hysteresis; Hysteresis; Pressure measurement; Q factor; Resonance; Resonant frequency; Sensor phenomena and characterization; Silicon; Structural beams; Temperature sensors; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1992. NAECON 1992., Proceedings of the IEEE 1992 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-0652-X
  • Type

    conf

  • DOI
    10.1109/NAECON.1992.220596
  • Filename
    220596