DocumentCode
3185619
Title
Resonant sensors for high accuracy pressure measurement using silicon technology
Author
Parson, P. ; Glendinning, A. ; Angelidis, D.
Author_Institution
Schlumberger Ind., Farnborough, UK
fYear
1992
fDate
18-22 May 1992
Firstpage
349
Abstract
A resonant element transducer has been developed for aerospace applications using micromachined silicon technology. The sensor is a beam supported over a square diaphragm. The resonant frequency of the beam is proportional to the applied pressure on the diaphragm. The authors describe the process of sensor construction, report on its physical characteristics, and summarize the performance evaluations which have been conducted to determine resonance frequency quality factor, temperature coefficient, and temperature and pressure hysteresis
Keywords
electric sensing devices; elemental semiconductors; micromechanical devices; pressure measurement; pressure sensors; pressure transducers; resonators; silicon; aerospace applications; micromachined Si technology; pressure hysteresis; pressure measurement; quality factor; resonant beam; resonant frequency; temperature coefficient; temperature hysteresis; Hysteresis; Pressure measurement; Q factor; Resonance; Resonant frequency; Sensor phenomena and characterization; Silicon; Structural beams; Temperature sensors; Transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1992. NAECON 1992., Proceedings of the IEEE 1992 National
Conference_Location
Dayton, OH
Print_ISBN
0-7803-0652-X
Type
conf
DOI
10.1109/NAECON.1992.220596
Filename
220596
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