Using ER models for microprocessor functional test coverage evaluation

Author

Benso, Alfredo ; Di Carlo, Stefano ; Prinetto, Paolo ; Savino, Alessandro ; Scionti, Alberto

Author_Institution

Dipt. di Autom. e Inf. Torino, Politec. di Torino, Turin

fYear

2008

fDate

6-8 Oct. 2008

Firstpage

139

Lastpage

142

Abstract

Test coverage evaluation is one of the most critical issues in microprocessor software-based testing. Whenever the test is developed in the absence of a structural model of the microprocessor, the evaluation of the final test coverage may become a major issue. In this paper, we present a microprocessor modeling technique based on entity-relationship diagrams allowing the definition and the computation of custom coverage functions. The proposed model is very flexible and particularly effective when a structural model of the microprocessor is not available.

Keywords

circuit analysis computing; circuit testing; microprocessor chips; entity-relationship diagram; microprocessor modeling technique; microprocessor software-based testing; structural model; test coverage evaluation; Automatic testing; Built-in self-test; Computer architecture; Electronic equipment testing; Erbium; Fault detection; Instruction sets; Microprocessors; Software testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Conference, 2008. BEC 2008. 11th International Biennial Baltic

Conference_Location

Tallinn

ISSN

1736-3705

Print_ISBN

978-1-4244-2059-9

Electronic_ISBN

1736-3705

Type

conf

DOI

10.1109/BEC.2008.4657498

Filename

4657498