Title :
A broadband flat gain high linearity gain block MMIC amplifier with built-in temperature compensation active bias circuitry
Author :
Lee Hang-Kiong ; Fuad, Haji-Mokhtar ; Tan Tiong-Heo ; Low Tang-Min
Author_Institution :
Wireless Semicond. Div. (WSD R&D), Avago Technol. (Malaysia) Sdn Bhd, Bayan Lepas, Malaysia
Abstract :
This paper describes design and realization of a broadband flat gain high linearity gain block MMIC amplifier with built-in temperature compensation active bias circuitry using a proprietary 0.25 ¿m enhancement mode pseudomorphic high electron mobility transistor (EpHEMT) technology. The MMIC amplifier delivers 14.5 dB gain with gain flatness achieved within ±0.25 dB from 200 MHz to 2.6 GHz while maintaining input and output return loss better than 10 dB. An internal built-in temperature compensation active bias circuitry is incorporated into the design to allow stable RF performance over temperature and process threshold voltage variation. The device has been optimized internally to offer high linearity of 37 dBm output intermodulation distortion (OIP3) across desired operating frequency band with a single supply 5 V @ 100 mA. At 900 MHz, the device typically provides 14.6 dB gain, 40 dBm OIP3, 22.5 dBm P1 dB and 3 dB NF. The amplifier is designed in a chip size of 0.90 à 0.95 mm2 and is housed in a low-cost RoHS-compliant SOT-89 industry-standard SMT package.
Keywords :
MMIC amplifiers; compensation; high electron mobility transistors; intermodulation distortion; wideband amplifiers; EpHEMT technology; SMT package; broadband flat gain high linearity gain block MMIC amplifier; built-in temperature compensation active bias circuitry; current 100 mA; frequency 200 MHz to 2.6 GHz; gain 14.5 dB; gain 14.6 dB; low-cost RoHS-compliant SOT-89 industry standard; noise figure 3 dB; operating frequency band; output intermodulation distortion; process threshold voltage variation; size 0.25 mum; voltage 5 V; Broadband amplifiers; Circuits; Electron mobility; Gain; HEMTs; Linearity; MMICs; MODFETs; PHEMTs; Temperature; Linearity; flatness; gain blocks; pHEMT; power amplifier; temperature compensation;
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
DOI :
10.1109/APMC.2009.5385379