• DocumentCode
    3186573
  • Title

    An introduction to the good, the bad, & the ugly face recognition challenge problem

  • Author

    Phillips, P. Jonathon ; Beveridge, J. Ross ; Draper, Bruce A. ; Givens, Geof ; Toole, Alice J O ; Bolme, David S. ; Dunlop, Joseph ; Lui, Yui Man ; Sahibzada, Hassan ; Weimer, Samuel

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2011
  • fDate
    21-25 March 2011
  • Firstpage
    346
  • Lastpage
    353
  • Abstract
    The Good, the Bad, & the Ugly Face Challenge Problem was created to encourage the development of algorithms that are robust to recognition across changes that occur in still frontal faces. The Good, the Bad, & the Ugly consists of three partitions. The Good partition contains pairs of images that are considered easy to recognize. On the Good partition, the base verification rate (VR) is 0.98 at a false accept rate (FAR) of 0.001. The Bad partition contains pairs of images of average difficulty to recognize. For the Bad partition, the VR is 0.80 at a FAR of 0.001. The Ugly partition contains pairs of images considered difficult to recognize, with a VR of 0.15 at a FAR of 0.001. The base performance is from fusing the output of three of the top performers in the FRVT 2006. The design of the Good, the Bad, & the Ugly controls for pose variation, subject aging, and subject “recognizability.” Subject recognizability is controlled by having the same number of images of each subject in every partition. This implies that the differences in performance among the partitions are result of how a face is presented in each image.
  • Keywords
    face recognition; pose estimation; FRVT 2006; base verification rate; face recognition; false accept rate; subject recognizability; Algorithm design and analysis; Face; Face recognition; Image recognition; Partitioning algorithms; Protocols; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Face & Gesture Recognition and Workshops (FG 2011), 2011 IEEE International Conference on
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-1-4244-9140-7
  • Type

    conf

  • DOI
    10.1109/FG.2011.5771424
  • Filename
    5771424