• DocumentCode
    3186649
  • Title

    Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model

  • Author

    Normand, E. ; Wert, J.L. ; Majewski, P.P. ; Oberg, D.L. ; Bartholet, W.G. ; Davis, S.K. ; Shoga, M. ; Wender, S.A. ; Gavron, A.

  • Author_Institution
    Boeing Defense & Space Group, Seattle, WA, USA
  • fYear
    1995
  • fDate
    34899
  • Firstpage
    33
  • Lastpage
    38
  • Abstract
    Microelectronic devices used in avionics were tested in the WNR beam, simulating atmospheric neutrons. The SEU upset rates for ARINC 429 receivers agree with rates in memories, and neutron-induced latchup was measured in the LCA100 K and 200 K gate arrays and compared against a new neutron-induced latchup model
  • Keywords
    avionics; errors; neutron effects; radiation hardening (electronics); ARINC 429 receivers; LCA100 K gate arrays; LCA200 K gate arrays; WNR neutron beam; atmospheric neutrons; avionics; latchup; memories; microelectronic devices; single event upset; Aerospace electronics; Circuit testing; Large scale integration; Logic devices; Logic testing; Monitoring; Particle beams; Performance evaluation; Single event upset; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
  • Conference_Location
    Madison, WI
  • Print_ISBN
    0-7803-3100-1
  • Type

    conf

  • DOI
    10.1109/REDW.1995.483373
  • Filename
    483373
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3186649