Title :
Radiation effects in Micrel MIC4427 MOSFET drivers
Author :
Skipper, M.D. ; Atkins, K. ; Hopkinson, G.R. ; LaBel, K.A.
Author_Institution :
Sira Ltd., Chislehurst, UK
Abstract :
Results of Co-60 total dose and heavy-ion latch-up testing indicate that the MIC4427 is capable of being used as a CCD clock driver in low dose rate space environments, up to a total dose of >50 krad(Si)
Keywords :
BiCMOS digital integrated circuits; driver circuits; gamma-ray effects; integrated circuit testing; ion beam effects; space vehicle electronics; 5E4 rad; CCD clock driver; CCD imager driving; Co; Co-60 total dose testing; MIC4427 MOSFET drivers; Micrel Semiconductor; heavy-ion latchup testing; low dose rate space environments; radiation effects; Annealing; Charge coupled devices; Clocks; Instruments; MOSFET circuits; NASA; Packaging; Radiation effects; Testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE
Conference_Location :
Madison, WI
Print_ISBN :
0-7803-3100-1
DOI :
10.1109/REDW.1995.483376
