Leakage in coplanar waveguides with finite metallization thickness and conductivity

Author

Jeng-Yi Ke ; Chun Hsiung Chen

Author_Institution

Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan

fYear

1995

fDate

16-20 May 1995

Firstpage

857

Abstract

The interesting phenomenon of leakage in a practical coplanar waveguide structure with finite metallization thickness and conductivity is investigated. By applying the modified spectral-domain approach, its attenuation constants due to both leakage and conductor loss are compared and discussed. In particular, the effective dielectric constant and attenuation constant are carefully studied, together with the current distributions within the metallic signal strip and ground planes.<>

Keywords

coplanar waveguides; current distribution; losses; metallisation; permittivity; spectral-domain analysis; waveguide theory; CPW structure; attenuation constant; attenuation constants; conductor loss; coplanar waveguides; current distributions; effective dielectric constant; finite conductivity; finite metallization thickness; leakage; modified spectral-domain approach; Attenuation; Conductivity; Conductors; Coplanar waveguides; Dielectric constant; Frequency; Green´s function methods; Integrated circuit packaging; Metallization; Strips;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1995., IEEE MTT-S International

Conference_Location

Orlando, FL, USA

ISSN

0149-645X

Print_ISBN

0-7803-2581-8

Type

conf

DOI

10.1109/MWSYM.1995.405912

Filename

405912