Title :
Leakage in coplanar waveguides with finite metallization thickness and conductivity
Author :
Jeng-Yi Ke ; Chun Hsiung Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
The interesting phenomenon of leakage in a practical coplanar waveguide structure with finite metallization thickness and conductivity is investigated. By applying the modified spectral-domain approach, its attenuation constants due to both leakage and conductor loss are compared and discussed. In particular, the effective dielectric constant and attenuation constant are carefully studied, together with the current distributions within the metallic signal strip and ground planes.<>
Keywords :
coplanar waveguides; current distribution; losses; metallisation; permittivity; spectral-domain analysis; waveguide theory; CPW structure; attenuation constant; attenuation constants; conductor loss; coplanar waveguides; current distributions; effective dielectric constant; finite conductivity; finite metallization thickness; leakage; modified spectral-domain approach; Attenuation; Conductivity; Conductors; Coplanar waveguides; Dielectric constant; Frequency; Green´s function methods; Integrated circuit packaging; Metallization; Strips;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.405912
