DocumentCode :
318676
Title :
An Expert System for Analytical Characterisation of Materials
Author :
Tjahjadi, T. ; Leung, H.Y. ; van Langevelde, F.
Author_Institution :
Department of Engineering, University of Warwick, Coventry, UK
Volume :
1
fYear :
1992
fDate :
17-21 Feb 1992
Firstpage :
494
Lastpage :
499
Keywords :
Biological materials; Electron emission; Expert systems; Information analysis; Mass spectroscopy; Monitoring; Production; Raman scattering; Surface contamination; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Instrumentation, 1992. SICICI '92. Proceedings., Singapore International Conference on
Print_ISBN :
0-7803-0632-5
Type :
conf
DOI :
10.1109/SICICI.1992.641829
Filename :
641829
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=318676
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