Title :
Independent component analysis in processing event related potentials in electroencephalograms
Author :
Tanskanen, J.M.A. ; Leppänen, J.M. ; Hietanen, J.K. ; Hyttinen, J.A.K.
Author_Institution :
Dept. of Biomed. Eng., Tampere Univ. of Technol., Tampere
Abstract :
In this paper, we propose an independent component analysis based method for fast event related potential detection for psychological and clinical electroencephalogram applications, and demonstrate the method with psychological facial expression ERP data. We conclude that ICA has great potential for fast ERP detection applications.
Keywords :
bioelectric potentials; electroencephalography; independent component analysis; electroencephalograms; event related potentials; independent component analysis; psychological facial expression ERP data; Biomedical measurements; Electrodes; Electroencephalography; Enterprise resource planning; Finite impulse response filter; Humans; Impedance measurement; Independent component analysis; Position measurement; Psychology;
Conference_Titel :
Electronics Conference, 2008. BEC 2008. 11th International Biennial Baltic
Conference_Location :
Tallinn
Print_ISBN :
978-1-4244-2059-9
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2008.4657531
