DocumentCode :
3186959
Title :
Ultrafast X-ray diffraction
Author :
von der Linde, D. ; Sokolowski-Tinten, K.
Author_Institution :
Inst. fur Laser und Plasmaphys., Essen Univ., Germany
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
163
Abstract :
This study presents recent developments and applications of ultrafast X-ray diffraction. These include optical pump/X-ray probe experiments for performing ultrafast X-ray spectroscopy, time-resolved X-ray diffraction for the investigation of electronically induced solid-liquid phase transformations in semiconductors, and time-resolved X-ray diffraction for monitoring the rapid changes of the atomic configuration associated with the lattice waves.
Keywords :
X-ray diffraction; X-ray spectroscopy; high-speed techniques; phase transformations; semiconductor materials; X-ray diffraction; atomic configuration; lattice waves; optical pump/X-ray probe experiments; solid-liquid phase transformations; time-resolved X-ray diffraction; ultrafast X-ray spectroscopy; Atomic beams; Biomedical optical imaging; Laser transitions; Optical pulses; Optical pumping; Pump lasers; Ultrafast electronics; Ultrafast optics; X-ray diffraction; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2003. EQEC '03. European
Print_ISBN :
0-7803-7733-8
Type :
conf
DOI :
10.1109/EQEC.2003.1314020
Filename :
1314020
Link To Document :
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