DocumentCode
3187001
Title
The effect of phase noise and spurs on coherent communications performance
Author
Korn, David S.
Author_Institution
Naval Res. Lab., Washington, DC, USA
Volume
1
fYear
1995
fDate
35009
Firstpage
383
Abstract
The effect of the stochastic properties of oscillator and frequency synthesizer (frequency source) phase noise and spurious frequencies (spectral purity) on coherent communications performance is measured and compared to the theoretical work. The stochastic properties are investigated; flicker-of-phase (1/f) and flicker-of-frequency (1/f 3) are non-Gaussian, while white phase (1/f0) and white frequency (1/f2) are Gaussian. Spurious frequencies (spurs) are Gaussian only if the conditions of the central limit theorem (CLT) apply, as is any summation of spurs and phase noise. A well-calibrated BER measurement on an otherwise-ideal BPSK link was repeated for two non-Gaussian sources, a 1/f3 phase noise and a single-spur, low phase noise source, both with a σφ high enough to induce noticable implementation loss. Compared to five different theoretical probability-of-error (Pe) equations all presuming Gaussian spectral purity, the measured BER for both sources were in the middle and close to each other
Keywords
Gaussian noise; flicker noise; frequency synthesizers; interference (signal); oscillators; phase noise; phase shift keying; stochastic processes; white noise; BER measurement; BPSK link; Gaussian spectral purity; coherent communications performance; flicker-of-frequency; flicker-of-phase; frequency synthesizer; implementation loss; nonGaussian sources; oscillator; phase noise; probability-of-error; spurious frequencies; spurs; stochastic properties; white frequency; white phase; Binary phase shift keying; Bit error rate; Frequency measurement; Frequency synthesizers; Loss measurement; Noise measurement; Oscillators; Phase measurement; Phase noise; Stochastic resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference, 1995. MILCOM '95, Conference Record, IEEE
Conference_Location
San Diego, CA
Print_ISBN
0-7803-2489-7
Type
conf
DOI
10.1109/MILCOM.1995.483392
Filename
483392
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