DocumentCode :
3187001
Title :
The effect of phase noise and spurs on coherent communications performance
Author :
Korn, David S.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Volume :
1
fYear :
1995
fDate :
35009
Firstpage :
383
Abstract :
The effect of the stochastic properties of oscillator and frequency synthesizer (frequency source) phase noise and spurious frequencies (spectral purity) on coherent communications performance is measured and compared to the theoretical work. The stochastic properties are investigated; flicker-of-phase (1/f) and flicker-of-frequency (1/f 3) are non-Gaussian, while white phase (1/f0) and white frequency (1/f2) are Gaussian. Spurious frequencies (spurs) are Gaussian only if the conditions of the central limit theorem (CLT) apply, as is any summation of spurs and phase noise. A well-calibrated BER measurement on an otherwise-ideal BPSK link was repeated for two non-Gaussian sources, a 1/f3 phase noise and a single-spur, low phase noise source, both with a σφ high enough to induce noticable implementation loss. Compared to five different theoretical probability-of-error (Pe) equations all presuming Gaussian spectral purity, the measured BER for both sources were in the middle and close to each other
Keywords :
Gaussian noise; flicker noise; frequency synthesizers; interference (signal); oscillators; phase noise; phase shift keying; stochastic processes; white noise; BER measurement; BPSK link; Gaussian spectral purity; coherent communications performance; flicker-of-frequency; flicker-of-phase; frequency synthesizer; implementation loss; nonGaussian sources; oscillator; phase noise; probability-of-error; spurious frequencies; spurs; stochastic properties; white frequency; white phase; Binary phase shift keying; Bit error rate; Frequency measurement; Frequency synthesizers; Loss measurement; Noise measurement; Oscillators; Phase measurement; Phase noise; Stochastic resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 1995. MILCOM '95, Conference Record, IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-2489-7
Type :
conf
DOI :
10.1109/MILCOM.1995.483392
Filename :
483392
Link To Document :
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