Title :
Millimeter-wave MEMS capacitive switch in vacuum-sealed in-line wafer level package
Author :
Yamamoto, Takashi ; Sogo, Takahiro ; Obata, Susumu ; Miyagi, Takeshi ; Hiura, Shigeru
Author_Institution :
Corp. Manuf. Eng. Center, Toshiba Corp., Yokohama, Japan
Abstract :
In this paper, we present a millimeter-wave microelectromechanical systems (MEMS) switch with a microsecond switching time. The optimization of the mechanical structure, application of high actuation voltages and encapsulation with a vacuum-sealed package result in a higher speed with which a beam of the MEMS switch is pulled in and pulled out. In order to reduce the packaging cost, we encapsulate the MEMS switch using an in-line wafer level package (WLP) which is built during the same complementary metal-oxide semiconductor (CMOS) process in which the MEMS switch is built. The fabricated MEMS switch is a shunt circuit and capacitive contact type. The dimensions of the in-line WLP are 500 ¿m wide by 500 ¿m long. The measurement results show an insertion loss of 0.5 dB and an isolation of 15 dB at a frequency of 50 GHz. The measured switching time is 2.0 ¿s or less. This is the shortest switching time of a MEMS capacitive switch for millimeter wave applications as far as the authors know.
Keywords :
CMOS integrated circuits; microswitches; millimetre wave devices; wafer level packaging; CMOS process; complementary metal-oxide semiconductor; loss 0.5 dB; microelectromechanical systems; microsecond switching time; millimeterwave MEMS capacitive switch; shunt circuit; time 2 mus; vacuum-sealed in-line wafer level package; Costs; Encapsulation; MOS devices; Microelectromechanical systems; Micromechanical devices; Microswitches; Semiconductor device packaging; Switches; Voltage; Wafer scale integration; CMOS; Microelectromechanical devices; encapsulation; millimeter wave switches;
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
DOI :
10.1109/APMC.2009.5385408