Title :
Drop/impact simulation and test validation of telecommunication products
Author :
Wu, Jason ; Song, Guoshu ; Yeh, Chao-pin ; Wyatt, Karl
Abstract :
Portable communication devices suffer impact-induced failure in usage. The products must pass drop/impact tests before shipment. The drop/impact performance is an important concern in product design. Due to the small size of this kind of electronic products, it is very expensive, time-consuming, and difficult to conduct drop tests to detect the failure mechanism and identify the drop behaviour. Finite element analysis provides a vital, powerful vehicle to solve this problem. The methodology of computer modeling, finite element method simulation and test validation techniques developed in ASMR at Motorola over the last two years are introduced in this paper. Two drop simulation and test validation cases in ASMR are reported in detail. The models are created with HYPERMESH, and the analysis is carried out with LS-DYNA3D. The analysis focuses on housing breakage, LCD cracking and structural disconnection under drop/impact shock. Apart from the computer simulation, a drop laboratory has been built in ASMR. With a customized drop tester, the drop orientation of the specimen can be controlled. The impact force relation to barrier, acceleration and strain inside the specimen during drop can be recorded in terms of time history curves. The test device, drop test and correlation of analysis and test data are illustrated in the paper. The simulation and test technology are applied to reliability identification and design support to Motorola´s products
Keywords :
cracks; electronic engineering computing; failure analysis; finite element analysis; fracture; impact (mechanical); impact testing; liquid crystal displays; mobile radio; reliability; software tools; telecommunication equipment testing; test equipment; HYPERMESH models; LCD cracking; LS-DYNA3D analysis; acceleration; analysis/test data correlation; computer modeling; computer simulation; customized drop tester; design support; drop behaviour; drop test; drop tests; drop/impact performance; drop/impact shock; drop/impact simulation; drop/impact tests; electronic product size; failure mechanism; finite element analysis; finite element method simulation; housing breakage; impact force; impact-induced failure; portable communication devices; product design; reliability identification; specimen drop orientation; strain; structural disconnection; telecommunication products; test device; test technology; test validation; test validation techniques; time history curves; Computational modeling; Computer simulation; Electric shock; Electronic equipment testing; Failure analysis; Finite element methods; Force control; Laboratories; Product design; Vehicles;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4475-8
DOI :
10.1109/ITHERM.1998.689582