• DocumentCode
    3187125
  • Title

    Uncertainty analysis in two-terminal impedance measurements with residual correction

  • Author

    Torrents, J.M. ; Pallas-Areny, R.

  • Author_Institution
    Dept. de Eng. Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1450
  • Abstract
    Residual impedance correction in impedance analyzers when using an asymmetrical test fixture needs three reference measurements, usually open circuit, short circuit, and load (meaning an impedance close to the impedance under test). This paper provides an uncertainty estimate for impedance measurements that apply a simple open/short correction in spite of using an asymmetrical test fixture. Experimental results show that the minimal uncertainty is obtained for impedance values close to the geometric mean of the short-circuit and open-circuit impedances, and that the theoretical prediction is indeed an upper limit for the actual uncertainty
  • Keywords
    electric impedance measurement; error compensation; measurement uncertainty; asymmetrical test fixture; impedance analyzers; open circuit; open/short correction; reference measurement; residual correction; residual impedance correction; short circuit; two-terminal impedance measurement; uncertainty estimate; Cables; Circuit testing; Electric variables measurement; Fixtures; Gain measurement; Impedance measurement; Joining processes; Measurement uncertainty; Predictive models; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • Conference_Location
    Budapest
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.929446
  • Filename
    929446