DocumentCode
3187181
Title
Experimental modeling for millimeter-wave monolithic integrated circuit components
Author
Lam, W. ; Sharma, A.K. ; Nakano, K. ; Ip, K. ; Yang, C. ; Liu, L. ; Yen, H.C.
Author_Institution
TRW, Redondo Beach, CA, USA
fYear
1988
fDate
25-27 May 1988
Firstpage
477
Abstract
An accurate distributed model of monolithic metal-insulator-metal (MIM) capacitors has been developed for computer-aided design (CAD) of millimeter-wave monolithic integrated circuits at V-band. The model is based on experimental measurements on microstrip ring resonators with and without the air-bridges and capacitors. The effects due to the air-bridge discontinuity, as well as dielectric and ohmic losses are taken into account. The calculated resonant frequencies are in good agreement with the experiments. This capacitor model reduces discrepancy in the resonant frequency by more than 30% compared with that used in commercial available programs. The distributed model of the MIM capacitor was utilized in the simulation of the performance of a V-band two-stage low-noise high-electron-mobility transistor (HEMT) amplifier. Computer simulations obtained using this model are in good agreement with the measured performance.<>
Keywords
capacitors; circuit CAD; circuit analysis computing; metal-insulator-metal devices; microwave integrated circuits; monolithic integrated circuits; semiconductor device models; CAD; HEMT amplifier simulation; MIM capacitor; MM wave type; MMIC; V-band; air-bridge discontinuity; computer-aided design; dielectron losses; distributed model; high-electron-mobility transistor; metal-insulator-metal; millimeter-wave; monolithic integrated circuit components; ohmic losses; resonant frequencies; Design automation; Dielectric losses; HEMTs; Integrated circuit modeling; MIM capacitors; Metal-insulator structures; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave transistors; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/MWSYM.1988.22078
Filename
22078
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