• DocumentCode
    3187181
  • Title

    Experimental modeling for millimeter-wave monolithic integrated circuit components

  • Author

    Lam, W. ; Sharma, A.K. ; Nakano, K. ; Ip, K. ; Yang, C. ; Liu, L. ; Yen, H.C.

  • Author_Institution
    TRW, Redondo Beach, CA, USA
  • fYear
    1988
  • fDate
    25-27 May 1988
  • Firstpage
    477
  • Abstract
    An accurate distributed model of monolithic metal-insulator-metal (MIM) capacitors has been developed for computer-aided design (CAD) of millimeter-wave monolithic integrated circuits at V-band. The model is based on experimental measurements on microstrip ring resonators with and without the air-bridges and capacitors. The effects due to the air-bridge discontinuity, as well as dielectric and ohmic losses are taken into account. The calculated resonant frequencies are in good agreement with the experiments. This capacitor model reduces discrepancy in the resonant frequency by more than 30% compared with that used in commercial available programs. The distributed model of the MIM capacitor was utilized in the simulation of the performance of a V-band two-stage low-noise high-electron-mobility transistor (HEMT) amplifier. Computer simulations obtained using this model are in good agreement with the measured performance.<>
  • Keywords
    capacitors; circuit CAD; circuit analysis computing; metal-insulator-metal devices; microwave integrated circuits; monolithic integrated circuits; semiconductor device models; CAD; HEMT amplifier simulation; MIM capacitor; MM wave type; MMIC; V-band; air-bridge discontinuity; computer-aided design; dielectron losses; distributed model; high-electron-mobility transistor; metal-insulator-metal; millimeter-wave; monolithic integrated circuit components; ohmic losses; resonant frequencies; Design automation; Dielectric losses; HEMTs; Integrated circuit modeling; MIM capacitors; Metal-insulator structures; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave transistors; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1988., IEEE MTT-S International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/MWSYM.1988.22078
  • Filename
    22078