BIT for intelligent system design and condition monitoring

Author

Gao, Robert X. ; Suryavanshi, Abhijit P.

Author_Institution

Dept. of Mech. & Ind. Eng., Massachusetts Univ., Amherst, MA, USA

Volume

3

fYear

2001

fDate

2001

Firstpage

1519

Abstract

The rapid growth of process automation requires that more efficient and reliable system testing and fault diagnosis techniques be developed to reduce machine down time and enhance productivity. As a design philosophy built-in-test (BIT) is receiving increasing attention. This paper presents an overview of diverse BIT applications in several areas of industry, including manufacturing, aerospace, and transportation

Keywords

aerospace industry; automobile industry; automotive electronics; avionics; built-in self test; computerised monitoring; condition monitoring; fault diagnosis; integrated circuit testing; machine testing; manufacturing industries; process monitoring; reviews; BIT applications; aerospace industry; automotive applications; avionics; condition monitoring; enhanced productivity; industrial applications; intelligent system design; machine fault diagnosis; manufacturing industry; mixed mode BIT; process monitoring; process optimization; reliable system testing; semiconductor chip testing; test pattern generation; Aerospace industry; Condition monitoring; Fault diagnosis; Intelligent systems; Machine intelligence; Machinery production industries; Manufacturing automation; Manufacturing industries; Productivity; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE

Conference_Location

Budapest

ISSN

1091-5281

Print_ISBN

0-7803-6646-8

Type

conf

DOI

10.1109/IMTC.2001.929458

Filename

929458