DocumentCode :
3187374
Title :
Steganography detection using localized generalization error model
Author :
He, Zhi-min ; Ng, Wing W Y ; Chan, Patrick P K ; Yeung, Daniel S.
Author_Institution :
Machine Learning & Cybern. Res. Center, South China Univ. of Technol., Guangzhou, China
fYear :
2010
fDate :
10-13 Oct. 2010
Firstpage :
1544
Lastpage :
1549
Abstract :
Steganography detection is a technique to tell whether there are secret messages hidden in images. The performance of a steganalysis system is mainly determined by the method of feature extraction and the architecture selection of the classifier. Selecting a proper classifier with proper parameters will improve the detection accuracy and generalization capability of the system. We propose a Radial Basis Function Neural Network (RBFNN) optimized by the Localized Generalization Error Model (L-GEM) for steganograhpy detection. In the proposed method, the discrete cosine transform (DCT) features and the Markov features are used as inputs of neural networks for detection. To enhance the generalization capability of the RBFNN and the performance of detecting steganography in future images, the architecture of the RBFNN is selected by minimizing the L-GEM. The experimental results show that the proposed method provides a better performance on testing images in comparison with the existing method in attacking Steghide, OutGuess and F5.
Keywords :
Markov processes; discrete cosine transforms; feature extraction; hidden feature removal; image coding; radial basis function networks; steganography; Markov feature; discrete cosine transform; feature extraction; hidden secret message extraction; localized generalization error model; radial basis function neural network; steganalysis system; steganography detection; Cryptography; JPEG; Localized Generalization Error Model; steganalysis; steganography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems Man and Cybernetics (SMC), 2010 IEEE International Conference on
Conference_Location :
Istanbul
ISSN :
1062-922X
Print_ISBN :
978-1-4244-6586-6
Type :
conf
DOI :
10.1109/ICSMC.2010.5642331
Filename :
5642331
Link To Document :
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