Title :
Sigma-delta techniques for integrated test and measurement
Author :
Hafed, Mohamed ; Roberts, Gordon W.
Author_Institution :
Microelectron. & Control Syst. Lab., McGill Univ., Montreal, Que., Canada
Abstract :
An area efficient and robust integrated test core for analog and mixed-signal circuits is described. The core consists of two signal generators that approximate the output of a sigma-delta modulator using finite repetitious bit patterns. When these structures are coupled with simple filtering techniques and using minimal analog components, the resulting system is capable of performing many measurement functions typical of spectrum analyzers, multimeters, and oscilloscopes
Keywords :
CMOS analogue integrated circuits; automatic testing; design for testability; embedded systems; integrated circuit testing; mixed analogue-digital integrated circuits; sigma-delta modulation; CMOS IC; analog circuits; design for test; embedded test; filtering; finite repetitious bit patterns; integrated test core; minimal analog components; mixed-signal circuits; sigma-delta modulator; sigma-delta techniques; signal generators; Circuit testing; Coupling circuits; Delta-sigma modulation; Filtering; Integrated circuit measurements; Oscilloscopes; Performance evaluation; Robustness; Signal generators; Spectral analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929468
