Title :
ADC histogram test by triangular small-waves
Author :
Alegria, Francisco ; Arpaia, Pasquale ; Serra, António M da Cruz ; Daponte, Pasquale
Author_Institution :
Telecommun. Inst., Inst. Superior Tecnico, Lisbon, Portugal
Abstract :
A histogram-based method for quasi-static test of analog-to-digital converters has been proposed for standardization aims. The test exploits the use of small-amplitude triangular waves. Different signal offset values are used to fully stimulate the converter input range. The reduced amplitude and slope of the input triangular wave with respect to the converter range and slew rate, respectively, lead to quasi-static test conditions. The test allows (i) linearity constraints of function generators to be relaxed, and (ii) experimental burdens to be reduced. In this paper, after a brief recalling of the test procedure, analytical relations for designing an efficient test are provided. Numerical and experimental results of a comparative analysis with the IEEE 1057-standard static test highlight its better performance
Keywords :
IEEE standards; analogue-digital conversion; integrated circuit testing; standardisation; ADC; IEEE 1057-standard static test; function generators; histogram test; linearity constraints; quasi-static test; signal offset values; slew rate; small-amplitude triangular waves; standardization; Analog-digital conversion; Histograms; Level measurement; Linearity; Performance analysis; Signal generators; Standardization; Testing; Voltage; World Wide Web;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929490
