DocumentCode :
3187790
Title :
Characterization and verification of phase-locked loops
Author :
Egan, Thomas ; Mourad, Samiha
Author_Institution :
Santa Clara Univ., CA, USA
Volume :
3
fYear :
2001
fDate :
2001
Firstpage :
1697
Abstract :
With the increasing use of phase-locked loops (PLLs) embedded in FPGAs, ASICs, and Systems-On-Chip (SOC), there is a growing need for methods to verify their operation. This paper describes a coherent list, which includes tests for lock, jitter, stability, and modulation response. The information is offered as a guide to the verification and testing of an embedded PLL. For that reason it is presented in such a way as to allow the reader to determine the extent to which the verification will be carried out. The tests are covered from the easiest to the most complicated to perform
Keywords :
circuit stability; integrated circuit testing; jitter; phase locked loops; ASICs; FPGAs; Systems-On-Chip; embedded PLL; jitter; lock; modulation response; phase-locked loops; stability; Circuit testing; Clocks; Field programmable gate arrays; Jitter; Phase detection; Phase frequency detector; Phase locked loops; Production; Prototypes; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
ISSN :
1091-5281
Print_ISBN :
0-7803-6646-8
Type :
conf
DOI :
10.1109/IMTC.2001.929491
Filename :
929491
Link To Document :
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