• DocumentCode
    3187792
  • Title

    Analysis on locking characteristics of band-stop type of self-injection locked NRD guide Gunn oscillator at 60 GHz

  • Author

    Ohue, Ko-ichi ; Kuroki, Futoshi ; Yoneyama, Tsukasa

  • Author_Institution
    Kure Nat. Coll. of Technol., Kure, Japan
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    2292
  • Lastpage
    2295
  • Abstract
    The Q-factor of the band-stop type of self-injection locked NRD (nonradiative dielectric waveguide) guide Gunn oscillator, which consists of a Gunn diode circuit coupled with a high Q ceramic resonator, was calculated as a function of the frequency deviation between the oscillation frequency of the free-running Gunn oscillator and the resonant frequency of the ceramic resonator in the 60 GHz bands. Agreement between the calculated and measured results was reasonably satisfactory, and thus the validity of the analytical procedure was confirmed. And it was obvious that the band-stop type of self-injection locked NRD guide Gunn oscillator has a high Q-factor as well as a low phase noise compared with the reflection type of self-injection locked NRD guide Gunn oscillator.
  • Keywords
    Gunn diodes; Gunn oscillators; Q-factor; injection locked oscillators; millimetre wave oscillators; nonradiative dielectric waveguides; resonators; Gunn diode circuit; Q-factor; band-stop type; free-running Gunn oscillator; frequency 60 GHz; frequency deviation; high Q ceramic resonator; locking characteristics; low phase noise; nonradiative dielectric waveguide; oscillation frequency; reflection type; resonant frequency; self-injection locked NRD guide Gunn oscillator; Ceramics; Coupling circuits; Dielectrics; Diodes; Gunn devices; Oscillators; Phase noise; Q factor; RLC circuits; Resonant frequency; Gunn oscillator; Millimeter-waves; NRD guide; and Self-injection locking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5385440
  • Filename
    5385440