• DocumentCode
    3187842
  • Title

    Sub-picosecond aperture uncertainty measurements

  • Author

    Chiorboli, Giovanni

  • Author_Institution
    Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1709
  • Abstract
    Sub-picosecond aperture uncertainty measurement is nowadays a challenge in the test of state-of-the-art high-speed high-resolution A/D converters. This work describes the existing techniques and analyzes the limits in the measurement accuracy obtainable with the double-channel techniques and the instrumentation available today. Preliminary experiment results are provided
  • Keywords
    analogue-digital conversion; high-speed integrated circuits; integrated circuit measurement; jitter; phase noise; double-channel techniques; high-resolution A/D converters; high-speed ICs; measurement accuracy; sub-picosecond aperture uncertainty measurements; Analog-digital conversion; Apertures; Area measurement; Frequency conversion; Jitter; Measurement uncertainty; Noise measurement; Phase measurement; Phase noise; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • Conference_Location
    Budapest
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.929493
  • Filename
    929493
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3187842