Title :
An interpolation scheme for precision reflection coefficient measurements at intermediate frequencies. I. Theoretical development
Author :
Cox, M.G. ; Dainton, M.P. ; Ridler, N.M.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Abstract :
The theoretical basis of an objective approach for impedance characteristic interpolation in the development of RF coaxial impedance standards is presented. Variants of the scheme apply to three impedances commonly used to calibrate vector reflectometers and automatic network analysers. The scheme permits impedance standards to be characterised at intermediate frequencies in terms of their values and associated measurement uncertainties
Keywords :
calibration; electric impedance measurement; interpolation; least squares approximations; measurement standards; measurement uncertainty; network analysers; reflectometers; reflectometry; RF coaxial impedance standards; automatic network analysers; calibration; constrained polynomial regression; data modelling; fitting functions; impedance characteristic interpolation; intermediate frequencies; interpolation scheme; least squares fitting; measurement uncertainties; model validation; precision reflection coefficient measurement; vector reflectometers; Calibration; Coaxial components; Frequency measurement; Impedance measurement; Interpolation; Laboratories; Measurement standards; Microwave frequencies; Radio frequency; Reflection;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929495
