DocumentCode :
3187919
Title :
Device temperature projection technique for IMS based systems
Author :
Holmes, Justin D. ; Stone, David A. ; Foster, Martin P.
Author_Institution :
Electrical Machines and Drives Group, Dept. of Electrical and Electronic Engineering, The University of Sheffield, Mappin Street, S1 3JD, UK
fYear :
2010
fDate :
19-21 April 2010
Firstpage :
1
Lastpage :
5
Abstract :
A system for projecting future device temperatures in insulated metal substrate (IMS) based systems is developed. The system utilises a Luenberger observer to estimate present device temperatures from accessible temperature measurement nodes. Future device temperatures are projected from these measurements permitting feed-forward control for active thermal management. Experimental results are presented verifying the accuracy of the proposed system.
Keywords :
IMS; Thermal Modelling; observer; thermal management;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Power Electronics, Machines and Drives (PEMD 2010), 5th IET International Conference on
Conference_Location :
Brighton, UK
Type :
conf
DOI :
10.1049/cp.2010.0170
Filename :
5522478
Link To Document :
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