Title :
Record high 18.6% efficient solar cell on HEM multicrystalline material
Author :
Rohatgi, A. ; Narasimha, S. ; Kamra, S. ; Doshi, P. ; Khattak, C.P. ; Emery, K. ; Field, H.
Author_Institution :
Center of Excellence in Photovoltaic Res. & Educ., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Solar cells with efficiencies as high as 18.6% (1 cm2 area) have been achieved by a process which involves impurity gettering and effective back surface passivation on 0.65 Ω-cm multicrystalline silicon (mc-Si) grown by the heat exchanger method (HEM). This represents the highest reported solar cell efficiency on mc-Si to date. PCD analysis revealed that the bulk lifetime (τb ) in HEM samples after phosphorus gettering can be as high as 135 μs. This increases the impact of the back surface recombination velocity (Sb) on the solar cell performance. By incorporating a deeper aluminum BSF, the Sb for solar cells in this study was lowered from 10000 cm/s to 2000 cm/s on HEM mc-Si. This combination of high τb and moderately low Sb resulted in the record high efficiency mc-Si solar cell. Model calculations indicate that lowering Sb further can raise the efficiency of untextured HEM mc-Si solar cells above 19.0%, thus closing the efficiency gap between good quality, untextured single crystal and mc-Si solar cells
Keywords :
carrier lifetime; crystal growth from melt; elemental semiconductors; getters; passivation; phosphorus; semiconductor growth; silicon; solar cells; surface recombination; 18.6 percent; HEM multicrystalline material; PCD analysis; Si; back surface passivation; back surface recombination velocity; bulk lifetime; heat exchanger method; impurity gettering; phosphorus gettering; solar cell efficiency; Alloying; Aluminum; Crystalline materials; Gettering; Impurities; Passivation; Photovoltaic cells; Photovoltaic systems; Silicon; Solar power generation;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564236