Title : 
Thermal dynamic model of precision wire-wound resistors
         
        
            Author : 
Szepessy, Zs ; Zoltan, I.
         
        
            Author_Institution : 
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Hungary
         
        
        
        
        
        
            Abstract : 
Wire-wound type resistors are often used as reference elements in high precision electronic instruments of industrial frequencies (50-60 Hz). One of the main factors in the measurement uncertainty of these instruments is the “self-heating” affected drift of the built-in wire-wound resistors. The materials, geometry, construction and the thermal environment of the resistors determine the dynamics of the load-affected drift. This paper investigates a thermal model that can be used for online estimation of the load affected thermal dynamic drift of commercially available encapsulated precision wire-wound resistors. Using the suggested model, the achievable estimation error of the relative change in resistance is below 10%. The model and the model-based online error estimation allowed us to reduce the measurement uncertainty of industrial high precision calibrators and to extend the power range of standard resistors in laboratories
         
        
            Keywords : 
calibration; measurement uncertainty; modelling; resistors; thermal analysis; commercially available encapsulated resistors; estimation error; high precision electronic instruments; industrial frequencies; industrial high precision calibrators; load-affected drift; measurement uncertainty; online estimation; precision wire-wound resistors; reference elements; self-heating; thermal dynamic drift; thermal dynamic model; Building materials; Construction industry; Electronics industry; Frequency; Industrial electronics; Instruments; Measurement uncertainty; Resistors; Thermal loading; Thermal resistance;
         
        
        
        
            Conference_Titel : 
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
         
        
            Conference_Location : 
Budapest
         
        
        
            Print_ISBN : 
0-7803-6646-8
         
        
        
            DOI : 
10.1109/IMTC.2001.929523