DocumentCode :
3188489
Title :
Foreword
fYear :
2005
fDate :
22-25 May 2005
Abstract :
These proceedings contain all the papers presented at the symposium that have been selected from the set of papers submitted to the ´formal´ category. Indeed, authors sending their work to the symposium had the possibility to submit either to the ´formal´ category or to the ´informal´ category. Then, both categories were reviewed by the program committee but different evaluation criteria were used for each category. Only selected papers from the formal category were included to these IEEE proceedings.
Keywords :
Circuit testing; Circuits and systems; Cities and towns; Electronic equipment testing; Europe; Microelectronics; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2005. European
Conference_Location :
Tallinn, Estonia
Print_ISBN :
0-7695-2341-2
Type :
conf
DOI :
10.1109/ETS.2005.25
Filename :
1429996
Link To Document :
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