Title :
ProTest: a low cost rapid prototyping and test system for ASICs and FPGAs
Author :
Jacomet, Marcel ; Wälti, Roger ; Winzenried, Lukas ; Perez, Jaime ; Gysel, Martin
Author_Institution :
Biel Sch. of Eng., MicroLab, Biel, Switzerland
Abstract :
The test bench methodology helps the design engineer to structure the simulation of his circuit. As showed in this paper, the test bench methodology can further be developed in order to efficiently reuse simulation stimuli and response for the real device under test. As FPGAs are very often used to prototype an ASIC design, an easy switch between simulation and real hardware test is necessary to establish a rapid prototyping design and test environment. Our ProTest system closes the gap between the simulation and the test environment with a low cast and easy to use computer-aided-test environment
Keywords :
VLSI; application specific integrated circuits; automatic test software; field programmable gate arrays; logic design; software prototyping; ASIC; ASIC design; FPGA; ProTest system; computer-aided-test; hardware test; rapid prototyping; simulation; test bench; Circuit simulation; Circuit testing; Computational modeling; Costs; Design engineering; Design methodology; Prototypes; Switches; System testing; Virtual prototyping;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643949