A global optimization technique for microwave nondestructive evaluation

Author

Pastorino, M. ; Caorsi, S. ; Massa, A.

Author_Institution

Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy

Volume

3

fYear

2001

fDate

2001

Firstpage

1916

Abstract

A global optimization technique based on a genetic algorithm is proposed for microwave nondestructive evaluation (NDE). Starting from an integral formulation, the NDE problem is recast into a two-steps procedure. Firstly, the presence of a flaw in a dielectric structure is detected by the analysis of a suitable cost function. Then, the geometric characteristics of the flaw are retrieved. A hybrid genetic algorithm is used and a multiview tomographic approach is applied

Keywords

crack detection; electromagnetic wave scattering; flaw detection; genetic algorithms; inverse problems; microwave imaging; nondestructive testing; tomography; NDE problem; NDT; cost function; dielectric structure; flaw detection; flaw geometric characteristics; global optimization technique; hybrid genetic algorithm; integral formulation; microwave nondestructive evaluation; multiview tomographic approach; Cost function; Dielectric materials; Electric variables measurement; Genetic algorithms; Genetic engineering; Inverse problems; Light scattering; Magnetic field measurement; Microwave theory and techniques; Nonlinear equations;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE

Conference_Location

Budapest

ISSN

1091-5281

Print_ISBN

0-7803-6646-8

Type

conf

DOI

10.1109/IMTC.2001.929534

Filename

929534