DocumentCode :
318854
Title :
Fault diagnosis of odd-even sorting networks
Author :
Hu, Chih Wei ; Lee, Chung Len ; Wu, Wen Ching ; Chen, Jwu E.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
1997
fDate :
17-19 Nov 1997
Firstpage :
288
Lastpage :
293
Abstract :
This paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are sufficient to detect single sorting element fault in an odd-even sorting network. For location tests for sorting element faults, the numbers of tests depend on the type of faults occurring at the sorting element. For most types of sorting element faults, the numbers are less than four specific tests. For the other types of faults, we have presented the test generation procedure and binary search procedures to generate the tests. The numbers of location tests are less than (n+log2n), where n=log2N and N is the number of inputs of the sorting network
Keywords :
fault diagnosis; Banyan networks; ISDN; binary search procedures; fault diagnosis; location tests; odd-even sorting networks; sorting element faults; switching system; B-ISDN; Fabrics; Fault detection; Fault diagnosis; Frequency; Hardware; Routing; Sorting; Switching systems; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
ISSN :
1081-7735
Print_ISBN :
0-8186-8209-4
Type :
conf
DOI :
10.1109/ATS.1997.643972
Filename :
643972
Link To Document :
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