• DocumentCode
    318854
  • Title

    Fault diagnosis of odd-even sorting networks

  • Author

    Hu, Chih Wei ; Lee, Chung Len ; Wu, Wen Ching ; Chen, Jwu E.

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    1997
  • fDate
    17-19 Nov 1997
  • Firstpage
    288
  • Lastpage
    293
  • Abstract
    This paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are sufficient to detect single sorting element fault in an odd-even sorting network. For location tests for sorting element faults, the numbers of tests depend on the type of faults occurring at the sorting element. For most types of sorting element faults, the numbers are less than four specific tests. For the other types of faults, we have presented the test generation procedure and binary search procedures to generate the tests. The numbers of location tests are less than (n+log2n), where n=log2N and N is the number of inputs of the sorting network
  • Keywords
    fault diagnosis; Banyan networks; ISDN; binary search procedures; fault diagnosis; location tests; odd-even sorting networks; sorting element faults; switching system; B-ISDN; Fabrics; Fault detection; Fault diagnosis; Frequency; Hardware; Routing; Sorting; Switching systems; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
  • Conference_Location
    Akita
  • ISSN
    1081-7735
  • Print_ISBN
    0-8186-8209-4
  • Type

    conf

  • DOI
    10.1109/ATS.1997.643972
  • Filename
    643972