Title :
Design of delay-verifiable combinational logic by adding extra inputs
Author :
Yu, Xiaoming ; Min, Yinghua
Author_Institution :
Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Abstract :
Correct operation of logic circuits requires not only the functional correctness, but also the correctness of temporal behavior. This paper deals with the problem of delay testability of two-level circuits through adding extra inputs. A design of delay-verifiable combinational logic by adding extra inputs is proposed, and a synthesis procedure is given. Experimental results show that the hardware overhead is about 1/3 of that of the methods proposed previously (1987, 1991), which aim at robust testable or VNR testable circuits. In fact, it is good enough to guarantee delay verifiability to satisfy the requirement of temporal correctness
Keywords :
combinational circuits; delays; design for testability; logic testing; delay testability; delay-verifiable combinational logic; hardware overhead; synthesis; temporal behavior; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Hardware; Logic circuits; Logic design; Logic testing; Propagation delay; Robustness;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643979