Title :
A new method for measuring the properties of dielectric substrate
Author_Institution :
Dielectric Lab. Inc., Cazenovia, NY, USA
Abstract :
The TE/sub 01/-mode in a cylindrical waveguide at a frequency below cutoff is used to probe a ceramic dielectric substrate located on the central plane between input and output coupling loops. Maximum transmission occurs at a frequency determined by the waveguide radius, the substrate thickness and the dielectric constant. The dielectric constant and loss tangent are obtained from the resonant frequency and the absorption bandwidth. The measurement is insensitive to the position of the substrate in the gap between waveguide sections, and no intimate contact is required.<>
Keywords :
dielectric loss measurement; materials testing; microwave measurement; permittivity measurement; production testing; TE/sub 01/-mode; absorption bandwidth; ceramic dielectric substrate; cylindrical waveguide; dielectric constant; frequency below cutoff; loss tangent; microwave materials testing; resonant frequency; substrate thickness; waveguide radius; Ceramics; Couplings; Cutoff frequency; Dielectric constant; Dielectric losses; Dielectric measurements; Dielectric substrates; Planar waveguides; Probes; Tellurium;
Conference_Titel :
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location :
New York, NY, USA
DOI :
10.1109/MWSYM.1988.22140
