Title : 
Combining binary-SVM and pairwise label constraints for multi-label classification
         
        
            Author : 
Gu, Weifeng ; Chen, Benhui ; Hu, Jinglu
         
        
            Author_Institution : 
Grad. Sch. of Inf., Production & Syst., Waseda Univ., Kitakyushu, Japan
         
        
        
        
        
        
            Abstract : 
Multi-label classification is an extension of traditional classification problem in which each instance is associated with a set of labels. Recent research has shown that the ranking approach is an effective way to solve this problem. In the multi-labeled sets, classes are often related to each other. Some implicit constraint rules are existed among the labels. So we present a novel multi-label ranking algorithm inspired by the pairwise constraint rules mined from the training set to enhance the existing method. In this method, one-against-all decomposition technique is used firstly to divide a multi-label problem into binary class sub-problems. A rank list is generated by combining the probabilistic outputs of each binary Support Vector Machine (SVM) classifier. Label constraint rules are learned by minimizing the ranking loss. Experimental performance evaluation on well-known multi-label benchmark datasets show that our method improves the classification accuracy efficiently, compared with some existed methods.
         
        
            Keywords : 
classification; data handling; probability; support vector machines; binary class subproblem; binary-SVM classifier; label constraint rule; multilabel classification; multilabel ranking; multilabeled set; one-against-all decomposition technique; pairwise constraint rule; pairwise label constraint; probabilistic output; rank list; support vector machine; Bioinformatics; Genomics; Radio access networks; Silicon; constraint rules; multi-label classification; support vector machine;
         
        
        
        
            Conference_Titel : 
Systems Man and Cybernetics (SMC), 2010 IEEE International Conference on
         
        
            Conference_Location : 
Istanbul
         
        
        
            Print_ISBN : 
978-1-4244-6586-6
         
        
        
            DOI : 
10.1109/ICSMC.2010.5642395