Title :
ADC testing with IEEE Std 1241-2000
Author :
Linnenbrink, Thomas E. ; Tilden, Steven J. ; Miller, Martin T.
Author_Institution :
Q-Dot Inc., Colorado Springs, CO, USA
Abstract :
While the new IEEE standard for ADC terminology and testing builds on IEEE Std 1057-1994 (for digitizing waveform recorders), 1241 relies strongly on frequency domain techniques. Frequency domain techniques tend to be favored in manufacturing because two records of data can produce a robust characterization of the ADC. Processing a small data record (e.g. 2-8 K sample) with an FFT yields SINAD, SNHR, THD, SFDR, IMD (with multiple input tones), and other useful data. Generating a histogram of a large record (e.g., 2-4 Msample) of overdriven data yields DNL and INL. Both theoretical and practical issues are addressed in the context of actual ADC characterization data
Keywords :
IEEE standards; analogue-digital conversion; fast Fourier transforms; frequency-domain analysis; integrated circuit testing; A/D converters; ADC characterization data; ADC testing; DNL; FFT; IEEE Std 1241-2000; IMD; INL; SFDR; SINAD; SNHR; THD; frequency domain techniques; histogram generation; robust characterization; sine wave testing; Clocks; Costs; Frequency domain analysis; Manufacturing; Production; Robustness; Terminology; Testing; USA Councils; Uniform resource locators;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929548
