Title :
ADC modeling and testing
Author :
Chiorboli, G. ; Morandi, C.
Author_Institution :
Dipartimento Ing. Inf., Parma Univ., Italy
Abstract :
The testing of ADCs can be performed either with the aim of globally assessing the performance of the converter in response to a standard stimulus, or with the aim of setting up a model of ADC operation which may help in predicting the response to an arbitrary stimulus. The first approach can be used for rough comparisons of similar devices, while the development of effective ADC models opens the way to calibration. In this context, the paper reviews some recent results in the strictly related fields of modeling and testing
Keywords :
analogue-digital conversion; calibration; frequency-domain analysis; integrated circuit modelling; integrated circuit testing; reviews; signal sampling; time-domain analysis; ADC modeling; ADC operation; ADC testing; arbitrary stimulus response; black box model; calibration; deterministic conversion law; dynamic tests; frequency domain analysis; macrocells; mixed-signal test; noise-power ratio; sampling jitter; static transfer characteristics; step response; time domain analysis; Analog-digital conversion; Calibration; Clocks; Performance evaluation; Predictive models; Sampling methods; Signal processing; Switching converters; Testing; Uniform resource locators;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929549
