ADC modeling and testing

Author

Chiorboli, G. ; Morandi, C.

Author_Institution

Dipartimento Ing. Inf., Parma Univ., Italy

Volume

3

fYear

2001

fDate

2001

Firstpage

1992

Abstract

The testing of ADCs can be performed either with the aim of globally assessing the performance of the converter in response to a standard stimulus, or with the aim of setting up a model of ADC operation which may help in predicting the response to an arbitrary stimulus. The first approach can be used for rough comparisons of similar devices, while the development of effective ADC models opens the way to calibration. In this context, the paper reviews some recent results in the strictly related fields of modeling and testing

Keywords

analogue-digital conversion; calibration; frequency-domain analysis; integrated circuit modelling; integrated circuit testing; reviews; signal sampling; time-domain analysis; ADC modeling; ADC operation; ADC testing; arbitrary stimulus response; black box model; calibration; deterministic conversion law; dynamic tests; frequency domain analysis; macrocells; mixed-signal test; noise-power ratio; sampling jitter; static transfer characteristics; step response; time domain analysis; Analog-digital conversion; Calibration; Clocks; Performance evaluation; Predictive models; Sampling methods; Signal processing; Switching converters; Testing; Uniform resource locators;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE

Conference_Location

Budapest

ISSN

1091-5281

Print_ISBN

0-7803-6646-8

Type

conf

DOI

10.1109/IMTC.2001.929549

Filename

929549