DocumentCode
3188786
Title
Characterization of Cu(InGa)Se2 solar cells with high Ga content
Author
Shafarman, W.N. ; Klenk, R. ; McCandless, B.E.
Author_Institution
Inst. of Energy Conversion, Delaware Univ., Newark, DE, USA
fYear
1996
fDate
13-17 May 1996
Firstpage
763
Lastpage
768
Abstract
Cu(InGa)Se2 thin films were deposited by elemental evaporation with x≡[Ga]/([In]+[Ga]) from 0.27 to 0.81 and bandgap (Eg) from 1.16 to 1.54 eV. The Cu(InGa)Se2 films were deposited with no gradients in the Ga and In and have no change in the structure or morphology as the Ga content increased. Glass/Mo/Cu(InGa)Se2/CdS/ZnO solar cells have ~15% efficiency with x<0.5 or Eg<1.3 eV. Voc increases over the entire bandgap range up to 820 mV but the cell efficiency falls off as Eg increases above 1.3 eV. Analysis of current-voltage and quantum efficiency measurements as a function of voltage show that this is attributable primarily to a voltage dependent current collection which results in a fall-off of fill factor, Jsc and, to a lesser extent, Voc. Finally, Cu(InGa)Se2 films with a Ga gradient are shown to improve fill factor in the high bandgap solar cells, apparently by improving the current collection
Keywords
copper compounds; electric current measurement; gallium compounds; indium compounds; semiconductor device testing; semiconductor growth; semiconductor thin films; solar cells; vapour deposited coatings; vapour deposition; voltage measurement; 1.16 to 1.54 eV; 15 percent; Cu(InGa)Se2 solar cells; CuInGaSe2; I-V characteristic measurements; bandgap range; current collection improvement; elemental evaporation; fill factor; morphology; open-circuit voltage; quantum efficiency measurements; semiconductor thin-film deposition; short-circuit current; solar cell characterisation; structure; Glass; Optical films; Optical losses; Photonic band gap; Photovoltaic cells; Short circuit currents; Sputtering; Substrates; Voltage; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location
Washington, DC
ISSN
0160-8371
Print_ISBN
0-7803-3166-4
Type
conf
DOI
10.1109/PVSC.1996.564240
Filename
564240
Link To Document