Title :
Scan Chain Bypass by Use of Skip Path
Author :
Fakhrieh, Fazel ; Shamshiri, Saeed ; Pedram, Ardavan ; Sobhani, Ashkan ; Navabi, Zainalabedin
Author_Institution :
Electrical and Computer Engineering Department University of Tehran, Iran, f.fakhrieh@ece.ut.ac.ir
Abstract :
The carry-skip used for fast adder design. This paper proposes such a method for reducing accumulated delay due to cascaded multiplexers in scan chains built for reuse of previously shifted data.
Keywords :
Carry Skip Adder; Design for Testability; Scan Chain; Adders; Automatic testing; Bandwidth; Channel capacity; Circuit testing; Clocks; Delay; Design engineering; Hardware; Multiplexing; Carry Skip Adder; Design for Testability; Scan Chain;
Conference_Titel :
Microelectronics, 2005. ICM 2005. The 17th International Conference on
Print_ISBN :
0-7803-9262-0
DOI :
10.1109/ICM.2005.1590042
