• DocumentCode
    3188836
  • Title

    Variance of the cumulative histogram of ADCs due to frequency errors

  • Author

    Alegria, F. Corrêa ; Serra, A. Cruz

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Inst. Superior Tecnico, Lisbon, Portugal
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    2021
  • Abstract
    The variance in the number of counts of the cumulative histogram, used for the characterization of ADCs with the histogram method, is calculated without any restrictions regarding frequency errors on the stimulus and sampling signals, number of periods periods of the stimulus signal and number of samples. This makes the approach here presented more general than the traditional one, used in IEEE 1057-1994 standard, where only a limited frequency error range is considered. The exact knowledge of this variance allows for a more efficient test of ADCs and a more precise determination of the uncertainty of the test result. Numerical simulation and experimental results that validate the theory are shown
  • Keywords
    analogue-digital conversion; calibration; higher order statistics; integrated circuit testing; measurement errors; measurement uncertainty; probability; signal sampling; ADC testing; IEEE 1057-1994 standard; cumulative histogram; frequency errors; number of counts variance; number of periods; number of samples; numerical simulation; sampling signals; stimulus signals; uncertainty; Analog-digital conversion; Clocks; Computer errors; Frequency conversion; Frequency estimation; Histograms; Probability density function; Sampling methods; Testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • Conference_Location
    Budapest
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.929553
  • Filename
    929553