DocumentCode
3188836
Title
Variance of the cumulative histogram of ADCs due to frequency errors
Author
Alegria, F. Corrêa ; Serra, A. Cruz
Author_Institution
Dept. of Electr. & Comput. Eng., Inst. Superior Tecnico, Lisbon, Portugal
Volume
3
fYear
2001
fDate
2001
Firstpage
2021
Abstract
The variance in the number of counts of the cumulative histogram, used for the characterization of ADCs with the histogram method, is calculated without any restrictions regarding frequency errors on the stimulus and sampling signals, number of periods periods of the stimulus signal and number of samples. This makes the approach here presented more general than the traditional one, used in IEEE 1057-1994 standard, where only a limited frequency error range is considered. The exact knowledge of this variance allows for a more efficient test of ADCs and a more precise determination of the uncertainty of the test result. Numerical simulation and experimental results that validate the theory are shown
Keywords
analogue-digital conversion; calibration; higher order statistics; integrated circuit testing; measurement errors; measurement uncertainty; probability; signal sampling; ADC testing; IEEE 1057-1994 standard; cumulative histogram; frequency errors; number of counts variance; number of periods; number of samples; numerical simulation; sampling signals; stimulus signals; uncertainty; Analog-digital conversion; Clocks; Computer errors; Frequency conversion; Frequency estimation; Histograms; Probability density function; Sampling methods; Testing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location
Budapest
ISSN
1091-5281
Print_ISBN
0-7803-6646-8
Type
conf
DOI
10.1109/IMTC.2001.929553
Filename
929553
Link To Document