DocumentCode :
3188874
Title :
Measurement of electromagnetic properties of absorbing materials in the aerospace industry: issues and (some) answers
Author :
Luippold, D.A. ; Mitzner, K.M. ; Hunzeker, D.S. ; Hant, W. ; Murray, F.J. ; Locus, S.S.
Author_Institution :
Northrop Corp., Pico Rivera, CA, USA
fYear :
1992
fDate :
18-25 June 1992
Abstract :
Summary form only given. Electromagnetic measurement problems that arise in connection with the use of radar absorbing material in aerospace design and production were reviewed. Some of the most successful and most promising measurement techniques were discussed. These include resonant stripline, waveguide, free space insertion loss, impedance measurement in a capacitive fixture, and Q-spoiling of a cavity. In many cases, a customary measurement procedure has had to be modified to take into account the special properties of the materials under test. One case history shows how a requirement to measure resistive sheet material at very high frequency through a dielectric coating was satisfied by developing a network analyzer probe that couples capacitively to the sheet.<>
Keywords :
aerospace industry; microwave measurement; radar cross-sections; Q-spoiling; aerospace industry; capacitive fixture; cavity; dielectric coating; electromagnetic properties; free space insertion loss; impedance measurement; measurement techniques; network analyzer probe; radar absorbing material; resistive sheet material; resonant stripline; waveguide; Aerospace materials; Dielectric measurements; Electromagnetic measurements; Electromagnetic waveguides; Measurement techniques; Production; Radar measurements; Resonance; Sheet materials; Stripline;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
Type :
conf
DOI :
10.1109/APS.1992.221404
Filename :
221404
Link To Document :
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