Title :
Q-band computerized slotted line system
Author :
An, Taehun ; Mao, James ; Meng, Qinghu ; Yan, Heng-Chao ; Fang, Jianwu
Author_Institution :
Microwave Inst., East China Normal Univ., Shanghai, China
Abstract :
An automatic test system for measuring network parameters at Q-band has been developed. The system is based on the conventional slotted line system and is controlled by the Apple II microcomputer. The principles, construction, and features of the system are presented. Typical results for complex reflection coefficient, voltage standing wave ratio, impedance, attenuation, and S-parameters are given. The system is expected to be valuable in developing test systems at the short-millimeter-wave band.<>
Keywords :
automatic test equipment; computerised instrumentation; microcomputer applications; microcomputers; microwave measurement; Apple II microcomputer; EHF; MM-wave; Q-band; S-parameters; VSWR; attenuation; automatic test system; complex reflection coefficient; computerized slotted line system; construction; features; impedance; operation; principles; short-millimeter-wave band; voltage standing wave ratio; Attenuation; Automatic control; Automatic testing; Control systems; Impedance; Microcomputers; Q measurement; Reflection; System testing; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location :
New York, NY, USA
DOI :
10.1109/MWSYM.1988.22141
